我们的优势是欧美进口备件配件，所有进口的冷门的停产的或者你们找不到

的产品都可以来找我！

美国西门子ITE全系列、EATON电机 断路器  接触器 变压器 、 GE电气 断路

器 接触器 变压器 、 Cutler-Hammer（卡特拉-汉莫）、艾默生电机、PQ、

VERSA  这些品牌我们价格都很美好。

欢迎前来询价！


厦门纪扬科技有限公司是一家以工业自动化为主营，融科、工、贸于一体，

专业从*工业自动化工程项目设计、安装、调试等服务和*销售各类进口**

电气及自动化产品的民营高新技术企业。综合型的工程技术服务型单位，是

国内专业的电气产品分销商及工业自动化系统集成商。

主营：世界知名品牌的PLC 、DCS 系统备件 模块

①Allen-Bradley(美国AB)系列产品》

②Schneider(施耐德电气)系列产品》

③General electric(通用电气)系列产品》

④Westinghouse（美国西屋）系列产品》

⑤SIEMENS(西门子系列产品)》

⑥销售ABB Robots. FANUC Robots、YASKAWA Robots、KUKA Robots、Mitsubishi Robots、OTC Robots、Panasonic Robots、MOTOMAN Robots。

⑦estinghouse（西屋）： OVATION系统、WDPF系统、MAX1000系统备件。

⑧Invensys Foxboro（福克斯波罗）：I/A Series系统，FBM（现场输入/输出模块）顺序控制、梯形 逻辑控制、事故追忆处理、数模转换、输入/输出信号处理、数据通信及处理等。Invensys Triconex: 冗余容错控制系统、基于三重模件冗余（TMR）结构的zui现代化的容错控制器。

⑨Siemens(西门子)：Siemens MOORE， Siemens Simatic C1，Siemens数控系统等。

⑩Bosch Rexroth（博世力士乐）：Indramat，I/O模块,PLC控制器,驱动模块等。

◆Motorola（摩托罗拉）：MVME 162、MVME 167、MVME1772、MVME177等系列。

Cummins    FS1251    Fuel filter

 
KLA Candela 8720 Wafer Inspection Equipment
KLA Candela 8720 Wafer Inspection Equipment
KLA Candela 8720 Wafer Inspection System
KLA Candela CS10 Compound Wafer Particle Inspection
KLA CI-T53P COMPONENT INSPECTION SYSTEM
KLA eDR-5200 PLUS Defect Review Sem WITH DEFECT CLASSIFICATION CAPABILITY
KLA eDR-5210 SEM - Defect Review (DR)
KLA eDR-5210 SEM - Defect Review (DR)
KLA eS805 E-beam Inspection
KLA FLX-5400 Stress Measurement
KLA FLX-5400 Stress Measurement
KLA ICOS T830 COMPONENT INSPECTION SYSTEM
KLA KLA 2133 Brightfield Inspection
KLA KLA 2133 Brightfield Inspection
KLA KLA 2133 Brightfield Inspection
KLA KLA 2138 Brightfield Inspection
KLA KLA 2138 Brightfield Inspection
KLA KLA 2138 Brightfield Inspection
KLA KLA 2138 Brightfield Inspection
KLA KLA 5100 Overlay Measurement System
KLA KLA 5200 Overlay Measurement System
KLA KLA 5200 Overlay Measurement System
KLA OmniMap RS50 Resistivity Measurement
KLA Opti-Probe 1600 Film Thickness Measurement System
KLA Opti-Probe 1600 Film Thickness Measurement System
KLA Opti-Probe 1600 Film Thickness Measurement System
KLA Opti-Probe 1600 Film Thickness Measurement System
KLA Opti-Probe 2600 Film Thickness Measurement System
KLA Opti-Probe 2600 Film Thickness Measurement System
KLA Opti-Probe 3290 Film Thickness Measurement System
KLA Opti-Probe 5240 Film Thickness Measurement System
KLA P22H Step Height Measurement Tool
KLA P-2H Profilometer
KLA P-2H Profilometer
KLA PROMETRIX FT750 Film Thickness Measurement
KLA Prometrix UV-1050 Film Thickness Measurement System
KLA Prometrix UV-1050 Film Thickness Measurement System
KLA Prometrix UV-1050 Film Thickness Measurement System
KLA Prometrix UV-1050 Film Thickness Measurement System
KLA Prometrix UV-1250SE Film Thickness Measurement System
KLA RS-35 Metrology Sheet resistance OMNP
KLA RS-35 Metrology Sheet resistance OMNP
KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2
KLA SpectraCD 100 Film Thickness Measurement System
KLA SpectraFX 200 Film Thickness Measurement System
KLA Surfscan 6400 Metrology Particles measurement (laser) INSP.TOOLS
KLA Surfscan 6420 Un-patterned Wafer particle Inspection System
KLA Surfscan 6420 Un-patterned Wafer particle Inspection System
KLA Surfscan 6420 Un-patterned Wafer particle Inspection System
KLA Surfscan AIT 3 Wafer particle Inspection
KLA UV1250SE Wafer Film measurement / Ellipsometer
KLA UV1280SE Thin Film Thickness Measurement System / Ellipsometer
KLA UV-1250SE Film Thickness Measurement System
KLA Viper 2401 Macro-Defect
KLA Viper 2401 Macro-Defect
KLA Viper 2401 Macro-Defect
KLA Viper 2401 Macro-Defect
KLA Viper 2430 Macro Defect Inspection
KLA Viper 2435 Macro Defect Inspection
KLA Viper 2435XP Macro Defect Inspection
KLA WI-2280 Wafer Inspection Equipment
KLA ZETA 20 3D Optical Profiling Microscope
KLA UV1280SE Thin Film Thickness measurement - Ellipsometer
KLA UV1280SE Thin Film Thickness measurement - Ellipsometer
KLA UV1280SE Thin Film Thickness measurement - Ellipsometer
KLA Tencor 2131 Wafer Defect Inspection
KLA Tencor AIT I Patterned Surface Inspection System